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US Patent Issued to Yangtze Memory Technologies on Aug. 11 for "Memories, operation methods of memories, and memory systems" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,165, issued on Aug. 11, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China). "Memories, operation methods of memories, and ... Read More


US Patent Issued to Yangtze Memory Technologies on Aug. 11 for "Memory devices, program methods, and memory systems" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,166, issued on Aug. 11, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China). "Memory devices, program methods, and memory s... Read More


US Patent Issued to Micron Technology on Aug. 11 for "Enhancing read window budget using read verify" (California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,167, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho). "Enhancing read window budget using read verify" was invente... Read More


US Patent Issued to Sandisk Technologies on Aug. 11 for "Dual word line all-string preprogram for lateral data retention improvement" (American, Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,168, issued on Aug. 11, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Dual word line all-string preprogram for lateral dat... Read More


US Patent Issued to Sandisk Technologies on Aug. 11 for "Data storage device having a memory block failure anticipation system" (California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,169, issued on Aug. 11, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Data storage device having a memory block failure an... Read More


US Patent Issued to Micron Technology on Aug. 11 for "Detecting extrinsic bitline defects" (Singaporean, Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,170, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho). "Detecting extrinsic bitline defects" was invented by Tingju... Read More


US Patent Issued to SAMSUNG ELECTRONICS on Aug. 11 for "Memory device including damage detection circuit and test system including the memory device" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,171, issued on Aug. 11, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Memory device including damage detection cir... Read More


US Patent Issued to Sandisk Technologies on Aug. 11 for "Faster method to prevent hybrid single level cell defects in system" (California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,172, issued on Aug. 11, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Faster method to prevent hybrid single level cell de... Read More


US Patent Issued to SEQUENOM on Aug. 11 for "Methods and processes for non-invasive assessment of genetic variations" (California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,175, issued on Aug. 11, was assigned to SEQUENOM Inc. (San Diego). "Methods and processes for non-invasive assessment of genetic variations... Read More


US Patent Issued to ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY on Aug. 11 for "Methods, systems, and computer readable media for generating codon optimized nucleotide sequences" (Arizona Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,176, issued on Aug. 11, was assigned to ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY (Scottsdale, Ariz.). "Methods, syste... Read More